Static analysis technology improves the testing process in medical devices
29/04/08
Recently, the Center for Devices and Radiological Health’s (CDRH) Office of Science and Engineering Laboratories (OSEL) has been investigating the use of static analysis technology to assist in a post-market investigation. This article gives a brief introduction to static analysis and explains how we used this technique to detect flaws.
In the past, the only way to trace the software flaws was to manually review the source code itself. Given the complexity of modern medical-device software, this is a very difficult and time-consuming task for a third-party investigator with no prior knowledge of the software.
Know more? Read this article by Raoul Jetley and Paul Anderson http://www.embedded.com/design/207000574
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